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IXDN402 / IXDI402 / IXDF402
Absolute Maximum Ratings (Note 1)
Operating Ratings
Parameter
Supply Voltage
Value
40 V
Parameter
Operating Temperature Range
Value
-55 oC to 125 oC
-0.3 V to VCC + 0.3 V
150 oC
-65 oC to 150 oC
300 oC
All Other Pins
Junction Temperature
Storage Temperature
Lead Temperature (10 sec)
Thermal Resistance (Junction to Case) ( θ JC )
Thermal Resistance (To Ambient)
8 Pin PDIP (PI) ( θ JA ) 130 K/W
8 Pin SOIC (SIA) 120 K/W
16 Pin SOIC (SIA-16) ( θ JA ) 120 K/W
θ JA with heat sink **
Heat sink area of 1 cm 2
8 Pin SOIC 100 K/W
8 Pin SOIC (SI)
16 Pin SOIC (SI-16)
10 K/W
10 K/W
16 Pin SOIC-CT 100 K/W
2
Heat sink area of 3 cm
8 Pin SOIC 90 K/W
16 Pin SOIC-CT 90 K/W
** Device soldered to metal back pane. Heat sink area is 1 oz.
copper on 1 side of 0.06" thick FR4 PC board.
Electrical Characteristics
Unless otherwise noted, T A = 25 o C, 4.5V ≤ V CC ≤ 35V .
All voltage measurements with respect to GND. IXDD402 configured as described in Test Conditions . All specifications are for one channel.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
V IH
V IL
High input voltage
Low input voltage
4.5V ≤ V CC ≤ 18V
4.5V ≤ V CC ≤ 18V
3
0.8
V
V
V IN
Input voltage range
-5
V CC + 0.3
V
I IN
Input current
0V ≤ V IN ≤ V CC
-10
10
μ A
V OH
V OL
High output voltage
Low output voltage
V CC - 0.025
0.025
V
V
R OH
Output resistance
V CC = 18V
3.7
4
?
@ Output high
R OL
Output resistance
V CC = 18V
2.5
3
?
@ Output Low
I PEAK
I DC
Peak output current
Continuous output
V CC is 18V
2
1
A
A
current
t R
t F
t ONDLY
Rise time
Fall time
On-time propagation
C L =1000pF Vcc=18V
C L =1000pF Vcc=18V
C L =1000pF Vcc=18V
8
8
28
10
9
32
ns
ns
ns
delay
t OFFDLY
Off-time propagation
C L =1000pF Vcc=18V
26
30
ns
delay
V CC
I CC
Power supply voltage
Power supply current
V IN = 3.5V
V IN = 0V
4.5
18
1
0
35
3
10
V
mA
μ A
V IN = + V CC
10
μ A
Specifications Subject To Change Without Notice
Note 1: Operating the device beyond the parameters listed as “Absolute Maximum Ratings” may cause permanent
damage to the device. Typical values indicate conditions for which the device is intended to be functional, but do not
guarantee specific performance limits. The guaranteed specifications apply only for the test conditions listed.
Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
3
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